Operating Temperature:-20°C to +60°C
Storage Temperature:-20°C to +70°C
Humidity Range:0% to 95% RH non-condensing
Power Supply Voltage:AC 100V ~ 240V, 50/60 Hz
Dimensions:240mm x 180mm x 90mm (WxDxH)
Display Resolution:800 x 600 pixels
Input Channels:4
Data Storage:Up to 10 years of continuous data logging
Communication Interface:RS-232, RS-485, Ethernet
Environmental Protection:IP65 (front panel only, not for side-by-side installation)
Experience unparalleled reliability and precision with the Yokogawa FX112-4-2 Paperless Chart Recorder, designed specifically for the most demanding industrial applications. This robust device ensures continuous monitoring and recording of critical process parameters without interruption.
Featuring an intuitive user interface and high-resolution monochrome LCD display, the FX112-4-2 allows for easy setup and operation, even in challenging environments. Its wide temperature range and waterproof design (IP65) make it suitable for a variety of industrial settings, ensuring dependable performance year-round.
With its 4-channel analog input capability, the recorder can monitor multiple sensors simultaneously, enabling comprehensive system analysis and control. The internal 1GB memory, expandable with an SD card, provides ample storage space for extensive data collection, facilitating detailed trend analysis and compliance with regulatory requirements.
The Yokogawa FX112-4-2 is equipped with a versatile power supply option, accepting a broad voltage range, ensuring compatibility with various industrial power sources. Its compact size and lightweight construction make it easy to integrate into existing machinery, minimizing installation time and complexity.
Leverage the predictive maintenance capabilities offered by this state-of-the-art recorder. By continuously monitoring process data, you can detect anomalies early, preventing unexpected downtime and reducing maintenance costs. The built-in logging feature automatically records data at specified intervals, allowing for seamless review and analysis post-event.
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